Title :
Testing complex couplings in multiport memories
Author :
Nicolaidis, M. ; Alves, V. Castro ; Bederr, H.
Author_Institution :
Reliable Integrated Syst. Group, Inst. Nat. Polytech. de Grenoble, France
fDate :
3/1/1995 12:00:00 AM
Abstract :
In this paper, the effects of simultaneous write access on the fault modeling of multiport RAMs are investigated. New fault models representing more accurately the actual faults in such memories are then defined. Subsequently, a general algorithm that ensures the detection of all faults belonging to the new fault model is proposed. Unfortunately, the obtained algorithms are of O(n/sup 2/) complexity which is not practical for real purposes. In order to reduce the complexity of the former test algorithm a topological approach has been developed. Finally, a BIST implementation of one of the proposed topological algorithms is presented.<>
Keywords :
built-in self test; fault diagnosis; integrated circuit testing; integrated memory circuits; multiport networks; network topology; random-access storage; BIST implementation; RAMs; complex couplings; fault modeling; multiport memories; simultaneous write access; topological approach; Application specific integrated circuits; Built-in self-test; Circuit faults; Circuit testing; Fault detection; Multiprocessing systems; Random access memory; Software libraries; Ultra large scale integration; Very large scale integration;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
