A unified design methodology for CMOS tapered buffers

In this paper, the various disparate approaches to CMOS tapered buffer design are unified into an integrated design methodology. Circuit speed, power dissipation, physical area, and system reliability are the four performance criteria of concern in tapered buffers, and each places a separate, often conflicting, constraint on the design of a tapered buffer. Enhanced short-channel tapered buffer design equations are presented for propagation delay and power dissipation, as well as a new split-capacitor model of hot-carrier reliability of tapered buffers and a two-component physical area model. Each performance criterion is individually investigated and analyzed with respect to the number of stages and tapering factor, and the interaction of the four criteria is examined to develop both a qualitative and a quantitative understanding of the various design tradeoffs. The creation of process dependent look-up tables for optimal buffer design is described, and a methodology to apply these look-up tables to application-specific tapered buffers for both unconstrained and constrained systems is developed.<>