DocumentCode
1246039
Title
Encoding strategy for maximum noise tolerance bidirectional associative memory
Author
Shen, Dan ; Cruz, Jose B., Jr.
Author_Institution
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
Volume
16
Issue
2
fYear
2005
fDate
3/1/2005 12:00:00 AM
Firstpage
293
Lastpage
300
Abstract
In this paper, the basic bidirectional associative memory (BAM) is extended by choosing weights in the correlation matrix, for a given set of training pairs, which result in a maximum noise tolerance set for BAM. We prove that for a given set of training pairs, the maximum noise tolerance set is the largest, in the sense that this optimized BAM will recall the correct training pair if any input pattern is within the maximum noise tolerance set and at least one pattern outside the maximum noise tolerance set by one Hamming distance will not converge to the correct training pair. This maximum tolerance set is the union of the maximum basins of attraction. A standard genetic algorithm (GA) is used to calculate the weights to maximize the objective function which generates a maximum tolerance set for BAM. Computer simulations are presented to illustrate the error correction and fault tolerance properties of the optimized BAM.
Keywords
content-addressable storage; error correction; fault tolerant computing; genetic algorithms; matrix algebra; neural nets; noise; Hamming distance; bidirectional associative memory; computer simulations; correlation matrix; encoding strategy; error correction; fault tolerance; genetic algorithm; maximum noise tolerance; neural network training; Associative memory; Computer simulation; Encoding; Error correction; Fault tolerance; Genetic algorithms; Hamming distance; Magnesium compounds; Neural networks; Pattern recognition; Bidirectional associative memory (BAM); energy well hyper-radius; neural network training; noise tolerance set; Electricity; Memory; Models, Neurological; Models, Statistical; Neural Networks (Computer);
fLanguage
English
Journal_Title
Neural Networks, IEEE Transactions on
Publisher
ieee
ISSN
1045-9227
Type
jour
DOI
10.1109/TNN.2004.841793
Filename
1402491
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