DocumentCode :
1246155
Title :
ARFTG 2009
Volume :
10
Issue :
3
fYear :
2009
fDate :
5/1/2009 12:00:00 AM
Firstpage :
51
Lastpage :
51
Abstract :
Describes the above-named upcoming conference event. May include topics to be covered or calls for papers.
Keywords :
Area measurement; Calibration; Microwave measurements;
fLanguage :
English
Journal_Title :
Microwave Magazine, IEEE
Publisher :
ieee
ISSN :
1527-3342
Type :
jour
DOI :
10.1109/MMM.2009.932087
Filename :
4820789
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1246155