ARFTG 2009

Volume

Issue

fYear

2009

fDate

5/1/2009 12:00:00 AM

Firstpage

Lastpage

Abstract

Describes the above-named upcoming conference event. May include topics to be covered or calls for papers.

Keywords

Area measurement; Calibration; Microwave measurements;

fLanguage

English

Journal_Title

Microwave Magazine, IEEE

Publisher

ieee

ISSN

1527-3342

Type

jour

DOI

10.1109/MMM.2009.932087

Filename

4820789

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