Title :
All-optical signal Processing and applications within the esprit project DO_ALL
Author :
Houbavlis, T. ; Zoiros, K.E. ; Kalyvas, M. ; Theophilopoulos, G. ; Bintjas, C. ; Yiannopoulos, K. ; Pleros, N. ; Vlachos, K. ; Avramopoulos, H. ; Schares, L. ; Occhi, L. ; Guekos, G. ; Taylor, J.R. ; Hansmann, S. ; Miller, W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Tech. Univ. of Athens, Greece
Abstract :
This paper reviews the work performed under the European ESPRIT project DO_ALL (Digital OpticAL Logic modules) spanning from advanced devices (semiconductor optical amplifiers) to all-optical modules (laser sources and gates) and from optical signal processing subsystems (packet clock recovery, optical write/store memory, and linear feedback shift register) to their integration in the application level for the demonstration of nontrivial logic functionality (all-optical bit-error-rate tester and a 2×2 exchange-bypass switch). The successful accomplishment of the project´s goals has opened the road for the implementation of more complex ultra-high-speed all-optical signal processing circuits that are key elements for the realization of all-optical packet switching networks.
Keywords :
error statistics; logic gates; modules; optical information processing; optical logic; optical storage; packet switching; semiconductor optical amplifiers; shift registers; synchronisation; all-optical signal processing; bit-error-rate tester; digital optical logic modules; exchange-bypass switch; gates; laser sources; linear feedback shift register; optical write/store memory; packet clock recovery; packet switching networks; semiconductor optical amplifiers; Integrated optics; Logic devices; Logic testing; Optical devices; Optical feedback; Optical packet switching; Optical signal processing; Performance evaluation; Signal processing; Stimulated emission; All-optical packet switching; all-optical signal processing; semiconductor optical amplifiers (SOAs); ultrafast nonlinear interferometer;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2004.838854
