• DocumentCode
    1246381
  • Title

    Thermal investigation of high power Optical Devices by transient testing

  • Author

    Farkas, Gábor ; Vader, Qv.V. ; Poppe, András ; Bognár, György

  • Volume
    28
  • Issue
    1
  • fYear
    2005
  • fDate
    3/1/2005 12:00:00 AM
  • Firstpage
    45
  • Lastpage
    50
  • Abstract
    In case of opto-electronic devices, the power applied on the device leaves in a parallel heat and light transport, the interpretation of Rth is not obvious. The paper shows results of a combined optical and thermal measurement for the characterization of power light emitting diodes (LEDs). A model explaining Rth changes at different current levels is proposed.
  • Keywords
    integrated optoelectronics; light emitting diodes; thermal analysis; thermo-optical devices; transient analysis; high power optical devices; light transport; optical measurement; optoelectronic devices; parallel heat transport; power light emitting diodes; thermal measurement; transient testing; Cooling; Electrical resistance measurement; Light emitting diodes; Optical devices; Optoelectronic devices; Power measurement; Silicon; Temperature; Testing; Thermal resistance; Light emitting diodes (LEDs); opto-electronic devices; thermal measurement;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2004.843197
  • Filename
    1402611
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1246381