• DocumentCode
    1246391
  • Title

    Fast Simulation of steady-state temperature distributions in electronic components using multidimensional model reduction

  • Author

    Celo, Dritan ; Gunupudi, Pavan K. ; Khazaka, Roni ; Walkey, David J. ; Smy, Tom ; Nakhla, Michel S.

  • Author_Institution
    Dept. of Electron., Carleton Univ., Ottawa, Canada
  • Volume
    28
  • Issue
    1
  • fYear
    2005
  • fDate
    3/1/2005 12:00:00 AM
  • Firstpage
    70
  • Lastpage
    79
  • Abstract
    In this paper, a model reduction technique is applied to the thermal modeling of electronic components and devices with complex geometries. The reduced-order model is capable of predicting a complete detailed three-dimensional temperature distribution in the original model. The small size and the simplicity of the reduced model allows for the very quick simulation of the device under a wide range of input parameters, such as different boundary conditions and power distributions. Use of the reduced-order model in a thermal design cycle can have a significant effect on both prediction accuracy and simulation efficiency. In the paper, the usefulness of this technique is demonstrated through examples from different electronic devices and packages. Accuracy of the reduced-order model is validated by comparison with the solution to a detailed numerical model.
  • Keywords
    Schottky gate field effect transistors; ball grid arrays; gallium compounds; integrated circuit modelling; integrated circuit packaging; reduced order systems; semiconductor device models; silicon-on-insulator; temperature distribution; thermal analysis; 3D temperature distribution; C4-CBGA package; GaN; GaN MESFET; compact modeling; complex geometries; device simulation; electronic components; integrated circuit component; multidimensional model reduction; reduced-order model; silicon on insulator clock driver; steady-state temperature distribution; thermal analysis; thermal design cycle; thermal modeling; Boundary conditions; Electronic components; Electronic packaging thermal management; Geometry; Multidimensional systems; Predictive models; Reduced order systems; Solid modeling; Steady-state; Temperature distribution; C4/CBGA package; Compact modeling; GaN MESFET; integrated circuit (IC) component; multidimensional model reduction; silicon on insulator (SOI) clock driver; thermal analysis;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2004.838877
  • Filename
    1402615