DocumentCode
1246391
Title
Fast Simulation of steady-state temperature distributions in electronic components using multidimensional model reduction
Author
Celo, Dritan ; Gunupudi, Pavan K. ; Khazaka, Roni ; Walkey, David J. ; Smy, Tom ; Nakhla, Michel S.
Author_Institution
Dept. of Electron., Carleton Univ., Ottawa, Canada
Volume
28
Issue
1
fYear
2005
fDate
3/1/2005 12:00:00 AM
Firstpage
70
Lastpage
79
Abstract
In this paper, a model reduction technique is applied to the thermal modeling of electronic components and devices with complex geometries. The reduced-order model is capable of predicting a complete detailed three-dimensional temperature distribution in the original model. The small size and the simplicity of the reduced model allows for the very quick simulation of the device under a wide range of input parameters, such as different boundary conditions and power distributions. Use of the reduced-order model in a thermal design cycle can have a significant effect on both prediction accuracy and simulation efficiency. In the paper, the usefulness of this technique is demonstrated through examples from different electronic devices and packages. Accuracy of the reduced-order model is validated by comparison with the solution to a detailed numerical model.
Keywords
Schottky gate field effect transistors; ball grid arrays; gallium compounds; integrated circuit modelling; integrated circuit packaging; reduced order systems; semiconductor device models; silicon-on-insulator; temperature distribution; thermal analysis; 3D temperature distribution; C4-CBGA package; GaN; GaN MESFET; compact modeling; complex geometries; device simulation; electronic components; integrated circuit component; multidimensional model reduction; reduced-order model; silicon on insulator clock driver; steady-state temperature distribution; thermal analysis; thermal design cycle; thermal modeling; Boundary conditions; Electronic components; Electronic packaging thermal management; Geometry; Multidimensional systems; Predictive models; Reduced order systems; Solid modeling; Steady-state; Temperature distribution; C4/CBGA package; Compact modeling; GaN MESFET; integrated circuit (IC) component; multidimensional model reduction; silicon on insulator (SOI) clock driver; thermal analysis;
fLanguage
English
Journal_Title
Components and Packaging Technologies, IEEE Transactions on
Publisher
ieee
ISSN
1521-3331
Type
jour
DOI
10.1109/TCAPT.2004.838877
Filename
1402615
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