• DocumentCode
    1246408
  • Title

    Prediction of stress-strain relationship with an improved Anand constitutive Model For lead-free solder Sn-3.5Ag

  • Author

    Chen, Xu ; Chen, Gang ; Sakane, Masao

  • Author_Institution
    Sch. of Chem. Eng. & Technol., Tianjin Univ., China
  • Volume
    28
  • Issue
    1
  • fYear
    2005
  • fDate
    3/1/2005 12:00:00 AM
  • Firstpage
    111
  • Lastpage
    116
  • Abstract
    An improved Anand constitutive model is proposed to describe the inelastic deformation of lead-free solder Sn-3.5Ag used in solder joints of microelectronic packaging. The new model accurately predicted the overall trend of steady-state stress-strain behavior of the solder for the temperature range from 233 K to 398 K and the strain rate range from 0.005 s-1 to 0.1 s-1. h0, a constant in the original Anand model, was set to a function of temperature and strain rate in the proposed model. Comparison of the experimental results and simulated results verified that the improved Anand model with modifying h0 to a function reasonably simulated the inelastic stress-strain relationships.
  • Keywords
    elastic deformation; electronics packaging; reliability; solders; stress-strain relations; tin alloys; 233 to 398 K; SnAg; improved anand constitutive model; inelastic deformation; inelastic stress-strain relationship; lead-free solder; microelectronic packaging; solder joints; Capacitive sensors; Deformable models; Environmentally friendly manufacturing techniques; Lead; Microelectronics; Packaging; Predictive models; Soldering; Steady-state; Temperature distribution; Anand model; Sn-3.5Ag; constitutive model; lead-free solder;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2004.843157
  • Filename
    1402620