DocumentCode :
1246426
Title :
Correlation of material properties to reliability performance of anisotropic conductive adhesive flip chip packages
Author :
Teo, Mary ; Mhaisalkar, Subodh G. ; Wong, E.H. ; Poi-Siong Teo ; Wong, C.C. ; Ong, Kristine ; Goh, Chin Foo ; Teh, Lay Kuan
Author_Institution :
Assembly & Interconnect Technol. Dept., Infineon Technol. Asia Pacific Pte. Ltd., Singapore, Singapore
Volume :
28
Issue :
1
fYear :
2005
fDate :
3/1/2005 12:00:00 AM
Firstpage :
157
Lastpage :
164
Abstract :
The anisotropic conductive adhesive (ACA) is a promising solder alternative candidate that shows potential for further pitch reduction. Although much work has been published on ACA joint behavior, study on correlation of material properties with reliability performance is still lacking. The main objective in this study was to identify the impact of material properties on reliability, so as to engineer highly reliable microelectronics assemblies. Four representative ACA materials (both film and paste types) with diverse properties were selected. Material properties were characterized as close as possible to "stress test" conditions so as to allow more accurate correlation predictions. Reliability performance was obtained by assembling test chips of 200-μm pitch onto BT-substrates, then subjecting them to reliability tests. Correlation analysis was conducted and key material properties that contributed to good reliability performance were identified. Findings indicated that the best properties for high reliability assemblies were: high adhesion strength after subjecting to "stress aging", low coefficient of moisture expansion (CME) and low elastic modulus (E).
Keywords :
adhesives; correlation methods; flip-chip devices; materials properties; reliability; stress analysis; 200 micron; ACA joint behavior; adhesive interconnection; anisotropic conductive adhesive flip chip packages; correlation analysis; elastic modulus; material properties; microelectronics assemblies; moisture expansion; pitch reduction; reliability performance; reliability tests; stress test; Anisotropic magnetoresistance; Assembly; Conductive adhesives; Flip chip; Material properties; Materials reliability; Packaging; Reliability engineering; Stress; Testing; Adhesive interconnection; anisotropic conductive adhesives (ACAs); correlation; flip chip; reliability;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2004.843175
Filename :
1402626
Link To Document :
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