• DocumentCode
    1246469
  • Title

    An integrated analog sensor for automatic alignment

  • Author

    Umminger, Christopher B. ; Sodini, Charles G.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
  • Volume
    30
  • Issue
    12
  • fYear
    1995
  • fDate
    12/1/1995 12:00:00 AM
  • Firstpage
    1382
  • Lastpage
    1390
  • Abstract
    Automatic alignment is a computationally intensive task that slows some manufacturing processes that require it. In order to improve alignment speed, we have designed a sensor that combines the imaging operation with the computation of the alignment error. The sensor provides x and y translation error signals when an image of the alignment mark is focused upon it. Photodiodes detect the image, and integrated amplifiers convert the photocurrents into an alignment error signal that is independent of illumination level. Alignment is accomplished in two steps. Coarse alignment is performed by operating as a four quadrant sensor, and fine positioning is achieved using edge detection. Measurements have demonstrated a minimum repeatability of 53 ppm and a maximum bandwidth of 7.5 kHz
  • Keywords
    BiCMOS analogue integrated circuits; analogue processing circuits; edge detection; errors; image sensors; measurement errors; photodiodes; position control; 7.5 kHz; alignment error computation; automatic alignment; coarse alignment; edge detection; fine positioning; four quadrant sensor; imaging operation; integrated amplifiers; integrated analog sensor; photodiode detectors; Bandwidth; Computer aided manufacturing; Focusing; Image converters; Image edge detection; Image sensors; Lighting; Manufacturing processes; Photoconductivity; Photodiodes;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.482165
  • Filename
    482165