Title :
An integrated analog sensor for automatic alignment
Author :
Umminger, Christopher B. ; Sodini, Charles G.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
fDate :
12/1/1995 12:00:00 AM
Abstract :
Automatic alignment is a computationally intensive task that slows some manufacturing processes that require it. In order to improve alignment speed, we have designed a sensor that combines the imaging operation with the computation of the alignment error. The sensor provides x and y translation error signals when an image of the alignment mark is focused upon it. Photodiodes detect the image, and integrated amplifiers convert the photocurrents into an alignment error signal that is independent of illumination level. Alignment is accomplished in two steps. Coarse alignment is performed by operating as a four quadrant sensor, and fine positioning is achieved using edge detection. Measurements have demonstrated a minimum repeatability of 53 ppm and a maximum bandwidth of 7.5 kHz
Keywords :
BiCMOS analogue integrated circuits; analogue processing circuits; edge detection; errors; image sensors; measurement errors; photodiodes; position control; 7.5 kHz; alignment error computation; automatic alignment; coarse alignment; edge detection; fine positioning; four quadrant sensor; imaging operation; integrated amplifiers; integrated analog sensor; photodiode detectors; Bandwidth; Computer aided manufacturing; Focusing; Image converters; Image edge detection; Image sensors; Lighting; Manufacturing processes; Photoconductivity; Photodiodes;
Journal_Title :
Solid-State Circuits, IEEE Journal of