DocumentCode :
1246573
Title :
Lognormal and Weibull accelerated life test plans under distribution misspecification
Author :
Pascual, Francis G. ; Montepiedra, Grace
Author_Institution :
Dept. of Math., Washington State Univ., Pullman, WA, USA
Volume :
54
Issue :
1
fYear :
2005
fDate :
3/1/2005 12:00:00 AM
Firstpage :
43
Lastpage :
52
Abstract :
In this article, we derive expressions for the asymptotic distribution of maximum likelihood estimators of model parameters in accelerated life tests (ALTs) when the model distribution is misspecified. We investigate results for two popular models, namely, the lognormal and Weibull Arrhenius-type ALT models. We propose test plan criteria based on asymptotic bias (ABias) and asymptotic mean squared error (AMSE) to derive ALT test plans. We derive 4:2:1 allocation plans that minimize either ABias2 or AMSE. These criteria provide control over estimation bias and variance when the model distribution is misspecified.
Keywords :
Weibull distribution; failure analysis; life testing; log normal distribution; maximum likelihood estimation; mean square error methods; reliability theory; Weibull Arrhenius-type models; Weibull accelerated life test; asymptotic bias; asymptotic distribution; asymptotic mean squared error; distribution misspecification; lognormal test; maximum likelihood estimators; model parameters; optimal test plans; type I censoring; Life estimation; Life testing; Lifetime estimation; Maximum likelihood estimation; Mean square error methods; Minimax techniques; Parameter estimation; Stress; Voltage; Weibull distribution; Asymptotic bias; asymptotic mean square error; optimal test plans; relative efficiency; type I censoring;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2004.837316
Filename :
1402679
Link To Document :
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