Optimal simple step-stress plan for cumulative exposure model using log-normal distribution

Author

Alhadeed, Abdulla A. ; Yang, Shie-Shien

Author_Institution

Dept. of Stat., United Arab Emirates Univ., Al-Ain, United Arab Emirates

Volume

54

Issue

1

fYear

2005

fDate

3/1/2005 12:00:00 AM

Firstpage

64

Lastpage

68

Abstract

Optimal times of changing stress level for simple step-stress plans under a cumulative exposure model using the log-normal distribution are determined for a wide range of values of the parameters in the model. A table of optimal times of changing stress level for various model parameters values is obtained. A formula for optimal time of changing stress level is also estimated from the table. This paper provides an optimal life testing plan which will enable us to accurately estimate the 50th percentile of the life time of a product being tested without having to wait long time for the product to fail.

Keywords

life testing; log normal distribution; maximum likelihood estimation; reliability; stress analysis; accelerated test; cumulative exposure; cumulative exposure model; log-normal distribution; maximum likelihood estimation; optimal life testing; optimal simple step-stress plan; product testing; step-stress; stress level; Acceleration; Distribution functions; Employee welfare; Life estimation; Life testing; Log-normal distribution; Maximum likelihood estimation; Statistical distributions; Stress; Sun; Accelerated test; cumulative exposure; log-normal distribution; maximum likelihood estimation; step-stress;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/TR.2004.841704

Filename

1402682