• DocumentCode
    1246591
  • Title

    A probabilistic approach to evaluate the reliability of piezoelectric micro-actuators

  • Author

    He, Zhimin ; Loh, Han Tong ; Ong, Eng Hong

  • Author_Institution
    Data Storage Inst., Singapore, Singapore
  • Volume
    54
  • Issue
    1
  • fYear
    2005
  • fDate
    3/1/2005 12:00:00 AM
  • Firstpage
    83
  • Lastpage
    91
  • Abstract
    In this paper, a probabilistic design approach is presented to evaluate the reliability of piezoelectric micro actuators. Based on the relationship between the lifetime, and degradation mechanism of piezoelectric actuators, and the electric field strength, the concept of "electric strength" is proposed to indicate the electric field strength of the piezoelectric actuators at a specified lifetime. The lifetime (number of cycles to failure) of the piezoelectric actuator, electric strength, and electric load are considered as the random variables; and their probability distributions are discussed. The interference model of electric load, and electric strength is introduced to the reliability design of piezoelectric micro actuators. By this approach, the relationship between the reliability, and the lifetime of the piezoelectric actuator can be given. A case study of the disk drive head positioning system demonstrates the application of the approach.
  • Keywords
    electric strength; microactuators; piezoelectric actuators; reliability; statistical distributions; degradation mechanism; disk drive head positioning system; electric field strength; electric load; fatigue; lifetime mechanism; piezoelectric microactuators reliability; probabilistic approach; probability distributions; Fatigue; Helium; Life estimation; Microactuators; Piezoelectric actuators; Probability density function; Probability distribution; Stress; Voltage; Weibull distribution; Electric strength; fatigue; lifetime; piezoelectric actuators; probability distribution; reliability;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2004.842089
  • Filename
    1402685