Title :
Modeling and analysis of correlated software failures of multiple types
Author :
Dai, Yuan-Shun ; Xie, Min ; Poh, Kim-Leng
Author_Institution :
Dept. of Comput. & Inf. Sci., Indiana Univ.-Purdue Univ., Indianapolis, IN, USA
fDate :
3/1/2005 12:00:00 AM
Abstract :
Most software reliability models assume independence of successive software runs. It is a strict assumption, and usually not valid in reality. Goseva-Popstojanova & Trivedi (2000) presented an interesting study on failure correlation among successive software runs. In this paper, by extending their results, a software reliability model is developed based on a Markov renewal process for the modeling of the dependence among successive software runs, where more than one type of failure is allowed in general formulation. Meanwhile, the cases of restarting with repair, and without repair, are considered. Although such a model is more complex than the traditional approach based on reliability growth, it incorporates more information about the failures, and system structure. A numerical example is also shown to illustrate the procedure, and provide some comparison.
Keywords :
Markov processes; failure analysis; software maintenance; software reliability; Markov renewal process; correlated software failure; dependent software runs; failure category; failure correlation; multiple failure types; reliability growth; repair; software reliability model; successive software runs; system structure; Degradation; Distribution functions; Failure analysis; Information science; Materials requirements planning; Reliability engineering; Software performance; Software reliability; Software testing; Systems engineering and theory; Dependent software runs; Markov renewal process; failure category; failure correlation; multiple failure types; software reliability;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.2004.841709