• DocumentCode
    1246600
  • Title

    Modeling and analysis of correlated software failures of multiple types

  • Author

    Dai, Yuan-Shun ; Xie, Min ; Poh, Kim-Leng

  • Author_Institution
    Dept. of Comput. & Inf. Sci., Indiana Univ.-Purdue Univ., Indianapolis, IN, USA
  • Volume
    54
  • Issue
    1
  • fYear
    2005
  • fDate
    3/1/2005 12:00:00 AM
  • Firstpage
    100
  • Lastpage
    106
  • Abstract
    Most software reliability models assume independence of successive software runs. It is a strict assumption, and usually not valid in reality. Goseva-Popstojanova & Trivedi (2000) presented an interesting study on failure correlation among successive software runs. In this paper, by extending their results, a software reliability model is developed based on a Markov renewal process for the modeling of the dependence among successive software runs, where more than one type of failure is allowed in general formulation. Meanwhile, the cases of restarting with repair, and without repair, are considered. Although such a model is more complex than the traditional approach based on reliability growth, it incorporates more information about the failures, and system structure. A numerical example is also shown to illustrate the procedure, and provide some comparison.
  • Keywords
    Markov processes; failure analysis; software maintenance; software reliability; Markov renewal process; correlated software failure; dependent software runs; failure category; failure correlation; multiple failure types; reliability growth; repair; software reliability model; successive software runs; system structure; Degradation; Distribution functions; Failure analysis; Information science; Materials requirements planning; Reliability engineering; Software performance; Software reliability; Software testing; Systems engineering and theory; Dependent software runs; Markov renewal process; failure category; failure correlation; multiple failure types; software reliability;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2004.841709
  • Filename
    1402688