Title :
Stochastic fault tree analysis with self-loop basic events
Author :
Jenab, K. ; Dhillon, B.S.
Author_Institution :
Dept. of Mech. & Aeronaut. Eng., Univ. of Ottawa, Ont., Canada
fDate :
3/1/2005 12:00:00 AM
Abstract :
This paper presents an analytical approach for performing fault tree analysis (FTA) with stochastic self-loop events. The proposed approach uses the flow-graph concept, and moment generating function (MGF) to develop a new stochastic FTA model for computing the probability, mean time to occurrence, and standard deviation time to occurrence of the top event. The application of the method is demonstrated by solving one example.
Keywords :
fault trees; flow graphs; reliability theory; stochastic processes; flow-graph concept; moment generating function; probability computing; reliability model; standard deviation; stochastic fault tree analysis; stochastic self-loop events; Application specific integrated circuits; DH-HEMTs; Distribution functions; Event detection; Fault detection; Fault trees; Field programmable gate arrays; Performance analysis; Stochastic processes; US Department of Transportation; Fault tree; flow-graph; reliability model; stochastic failure analysis;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.2004.842087