DocumentCode :
1246714
Title :
Silicon bipolar device structures for digital applications: technology trends and future directions
Author :
Warnock, James D.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume :
42
Issue :
3
fYear :
1995
fDate :
3/1/1995 12:00:00 AM
Firstpage :
377
Lastpage :
389
Abstract :
The double-polysilicon self-aligned bipolar device structure has come a long way since its first inception, but there is still room for further scaling of this structure and continued improvements in performance. An analysis of the current state-of-the-art double-poly structure leads naturally to a discussion of future trends and technologies necessary to continue scaling into the sub-0.25 μm regime. In addition, it has become highly desirable to extend bipolar processes in new directions to take advantage of the opportunities offered by emerging materials technologies, such as bonded silicon-on-insulator films and medium or low temperature Si and SiGe epitaxy. Opportunities also exist for high-performance bipolars in BiCMOS technology and in complementary bipolar processes for low-power, high-speed digital applications. These extensions beyond “conventional” bipolar technology will be discussed in terms of their requirements and the device structures that are evolving to match these needs
Keywords :
bipolar transistors; semiconductor technology; silicon; technological forecasting; 0.25 micron; BiCMOS technology; Si; SiGe; bonded silicon-on-insulator films; complementary bipolar processes; double-polysilicon self-aligned bipolar device structure; low temperature epitaxy; low-power high-speed digital applications; medium temperature epitaxy; scaling; technology trends; BiCMOS integrated circuits; Bipolar transistors; Bonding; Germanium silicon alloys; Materials science and technology; Paper technology; Parasitic capacitance; Silicon germanium; Silicon on insulator technology; Very large scale integration;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.368033
Filename :
368033
Link To Document :
بازگشت