DocumentCode
1246751
Title
TFSOI complementary BiCMOS technology for low power applications
Author
Huang, W.-L.M. ; Klein, Kevin M. ; Grimaldi, M. ; Racanelli, Marco ; Ramaswami, Shri ; Tsao, J. ; Foerstner, Juergen ; Hwang, Bor-Yuan C.
Author_Institution
Adv. Custom Technol., Motorola Inc., Mesa, AZ, USA
Volume
42
Issue
3
fYear
1995
fDate
3/1/1995 12:00:00 AM
Firstpage
506
Lastpage
512
Abstract
A Thin-Film-Silicon-On-Insulator Complementary BiCMOS (TFSOI CBiCMOS) technology has been developed for low power applications. The technology is based on a manufacturable, near-fully-depleted 0.5 μm CMOS process with the lateral bipolar devices integrated as drop-in modules for CBiCMOS circuits. The near-fully-depleted CMOS device design minimizes sensitivity to silicon thickness variation while maintaining the benefits of SOI devices. The bipolar device structure emphasizes use of a silicided polysilicon base contact to reduce base resistance and minimize current crowding effects. A split-oxide spacer integration allows independent control of the bipolar base width and emitter contact spacing. Excellent low power performance is demonstrated through low current ECL and low voltage, low power CMOS circuits. A 70 ps ECL gate delay at a gate current of 20 μA is achieved. This represents a factor of 3 improvement over bulk trench-isolated double-polysilicon self-aligned bipolar circuits. Similarly, CMOS gate delay shows a factor of 2 improvement over bulk silicon at a power supply voltage of 3.3 V. Finally, a 460 μW 1 GHz prescaler circuit is demonstrated using this technology
Keywords
BiCMOS integrated circuits; delays; emitter-coupled logic; integrated circuit technology; prescalers; scaling circuits; silicon-on-insulator; 0.5 mum; 1 GHz; 20 muA; 3.3 V; 460 muW; 70 ps; CMOS gate delay; ECL gate delay; TFSOI complementary BiCMOS technology; base resistance reduction; bipolar base width; current crowding effects; drop-in modules; emitter contact spacing; gate current; lateral bipolar devices; low current ECL; low power applications; low voltage low power CMOS circuits; near-fully-depleted CMOS process; prescaler circuit; silicided polysilicon base contact; split-oxide spacer integration; thin film SOI complementary BiCMOS; BiCMOS integrated circuits; CMOS process; CMOS technology; Contact resistance; Delay; Integrated circuit manufacture; Integrated circuit technology; Manufacturing processes; Proximity effect; Silicon;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.368047
Filename
368047
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