• DocumentCode
    1246751
  • Title

    TFSOI complementary BiCMOS technology for low power applications

  • Author

    Huang, W.-L.M. ; Klein, Kevin M. ; Grimaldi, M. ; Racanelli, Marco ; Ramaswami, Shri ; Tsao, J. ; Foerstner, Juergen ; Hwang, Bor-Yuan C.

  • Author_Institution
    Adv. Custom Technol., Motorola Inc., Mesa, AZ, USA
  • Volume
    42
  • Issue
    3
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    506
  • Lastpage
    512
  • Abstract
    A Thin-Film-Silicon-On-Insulator Complementary BiCMOS (TFSOI CBiCMOS) technology has been developed for low power applications. The technology is based on a manufacturable, near-fully-depleted 0.5 μm CMOS process with the lateral bipolar devices integrated as drop-in modules for CBiCMOS circuits. The near-fully-depleted CMOS device design minimizes sensitivity to silicon thickness variation while maintaining the benefits of SOI devices. The bipolar device structure emphasizes use of a silicided polysilicon base contact to reduce base resistance and minimize current crowding effects. A split-oxide spacer integration allows independent control of the bipolar base width and emitter contact spacing. Excellent low power performance is demonstrated through low current ECL and low voltage, low power CMOS circuits. A 70 ps ECL gate delay at a gate current of 20 μA is achieved. This represents a factor of 3 improvement over bulk trench-isolated double-polysilicon self-aligned bipolar circuits. Similarly, CMOS gate delay shows a factor of 2 improvement over bulk silicon at a power supply voltage of 3.3 V. Finally, a 460 μW 1 GHz prescaler circuit is demonstrated using this technology
  • Keywords
    BiCMOS integrated circuits; delays; emitter-coupled logic; integrated circuit technology; prescalers; scaling circuits; silicon-on-insulator; 0.5 mum; 1 GHz; 20 muA; 3.3 V; 460 muW; 70 ps; CMOS gate delay; ECL gate delay; TFSOI complementary BiCMOS technology; base resistance reduction; bipolar base width; current crowding effects; drop-in modules; emitter contact spacing; gate current; lateral bipolar devices; low current ECL; low power applications; low voltage low power CMOS circuits; near-fully-depleted CMOS process; prescaler circuit; silicided polysilicon base contact; split-oxide spacer integration; thin film SOI complementary BiCMOS; BiCMOS integrated circuits; CMOS process; CMOS technology; Contact resistance; Delay; Integrated circuit manufacture; Integrated circuit technology; Manufacturing processes; Proximity effect; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.368047
  • Filename
    368047