• DocumentCode
    1246794
  • Title

    Computerized digitizing technique for DLTS measurements

  • Author

    Avila-Garcia, Alejandm ; Barranca, Alfred0 Reyes

  • Author_Institution
    Dept. of Electr. Eng., Centro de Investigacion y de Estudios Avanzados, IPN, Mexico City, Mexico
  • Volume
    43
  • Issue
    6
  • fYear
    1994
  • fDate
    12/1/1994 12:00:00 AM
  • Firstpage
    936
  • Lastpage
    939
  • Abstract
    An enhanced version of an algorithm developed by Maguire and Marshall in their computerized DLTS system is presented. Improvements consist of introducing analysis of partial processing of digitized transients by deleting the initial part, which usually includes the loading transient caused by the measurement circuit RC constant. Also, a method to calculate trap concentration without using correlation functions is added. Some of the limitations involved with the use of this algorithm are also discussed
  • Keywords
    computerised instrumentation; deep level transient spectroscopy; spectroscopy; spectroscopy computing; DLTS measurements; Maguire and Marshall; computerized digitizing technique; correlation functions; deep level transient spectroscopy; digitized transients; loading transient; measurement circuit RC constant; partial processing; semiconductor defects; trap concentration; Capacitance; Circuits; Data acquisition; Distortion measurement; Filling; Laboratories; Spectroscopy; Temperature dependence; Time measurement; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.368071
  • Filename
    368071