Title :
Analog system-level fault diagnosis based on a symbolic method in the frequency domain
Author :
You, Zhihong ; Sanchez-Sinencio, Edgar ; De Gyvez, Jose Pineda
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
fDate :
2/1/1995 12:00:00 AM
Abstract :
Concurrently, a symbolic approach for analog system-level fault. Diagnosis and a systematic approach to maximize the fault location capability are proposed. This unified approach is realized as a result of combining the simulation before test (SBT) fault dictionary diagnosis method with a symbolic approach. The traditional SBT fault dictionary method is often costly aid inefficient because of a high number of simulations, but it can become very efficient when a symbolic approach is employed. This symbolic approach only requires one analysis for circuit topology to generate the network transfer function and a parameter substitution to obtain the frequency response (or time response) of the system. An efficient program is developed to deal with the frequency responses of the system to provide the optimum testing point set, and to automatically generate the fault dictionary. The “distance” between the measurement data and the frequency responses from the fault dictionary is evaluated to determine the diagnosis results. A practical example is presented in order to illustrate the main features of this proposed analog system fault diagnosis approach
Keywords :
circuit analysis computing; electronic equipment testing; fault diagnosis; frequency-domain analysis; symbol manipulation; transfer functions; analog system-level fault diagnosis; fault dictionary diagnosis; fault location capability; feasibility analysis; frequency domain; frequency responses; optimum testing point selection; optimum testing point set; simulation before test; symbolic approach; symbolic method; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Circuit topology; Dictionaries; Fault diagnosis; Fault location; Frequency; Transfer functions;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on