• DocumentCode
    1246838
  • Title

    Analog system-level fault diagnosis based on a symbolic method in the frequency domain

  • Author

    You, Zhihong ; Sanchez-Sinencio, Edgar ; De Gyvez, Jose Pineda

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • Volume
    44
  • Issue
    1
  • fYear
    1995
  • fDate
    2/1/1995 12:00:00 AM
  • Firstpage
    28
  • Lastpage
    35
  • Abstract
    Concurrently, a symbolic approach for analog system-level fault. Diagnosis and a systematic approach to maximize the fault location capability are proposed. This unified approach is realized as a result of combining the simulation before test (SBT) fault dictionary diagnosis method with a symbolic approach. The traditional SBT fault dictionary method is often costly aid inefficient because of a high number of simulations, but it can become very efficient when a symbolic approach is employed. This symbolic approach only requires one analysis for circuit topology to generate the network transfer function and a parameter substitution to obtain the frequency response (or time response) of the system. An efficient program is developed to deal with the frequency responses of the system to provide the optimum testing point set, and to automatically generate the fault dictionary. The “distance” between the measurement data and the frequency responses from the fault dictionary is evaluated to determine the diagnosis results. A practical example is presented in order to illustrate the main features of this proposed analog system fault diagnosis approach
  • Keywords
    circuit analysis computing; electronic equipment testing; fault diagnosis; frequency-domain analysis; symbol manipulation; transfer functions; analog system-level fault diagnosis; fault dictionary diagnosis; fault location capability; feasibility analysis; frequency domain; frequency responses; optimum testing point selection; optimum testing point set; simulation before test; symbolic approach; symbolic method; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Circuit topology; Dictionaries; Fault diagnosis; Fault location; Frequency; Transfer functions;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.368107
  • Filename
    368107