Title :
A Bayesian segmentation methodology for parametric image models
Author :
LaValle, Steven M. ; Hutchinson, Seth A.
Author_Institution :
Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
fDate :
2/1/1995 12:00:00 AM
Abstract :
Region-based image segmentation methods require some criterion for determining when to merge regions. This paper presents a novel approach by introducing a Bayesian probability of homogeneity in a general statistical context. The authors´ approach does not require parameter estimation and is therefore particularly beneficial for cases in which estimation-based methods are most prone to error: when little information is contained in some of the regions and, therefore, parameter estimates are unreliable. The authors apply this formulation to three distinct parametric model families that have been used in past segmentation schemes: implicit polynomial surfaces, parametric polynomial surfaces, and Gaussian Markov random fields. The authors present results on a variety of real range and intensity images
Keywords :
Bayes methods; Gaussian processes; Markov processes; image segmentation; image texture; polynomials; probability; Bayesian probability of homogeneity; Bayesian segmentation methodology; Gaussian Markov random fields; estimation-based methods; implicit polynomial surfaces,; intensity images; parametric image models; parametric model families; parametric polynomial surfaces; range images; region-based image segmentation; Approximation algorithms; Bayesian methods; Equations; Image segmentation; Markov random fields; Parameter estimation; Parametric statistics; Pattern classification; Polynomials; Probability;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on