Title :
Fitting a second degree curve in the presence of error
Author :
Werman, Michael ; Geyzel, Z.
Author_Institution :
Dept. of Comput. Sci., Hebrew Univ., Jerusalem, Israel
fDate :
2/1/1995 12:00:00 AM
Abstract :
This correspondence presents a statistically sound, simple and, fast method to estimate the parameters of a second degree curve from a set of noisy points that originated from the curve
Keywords :
curve fitting; image processing; pattern classification; polynomials; low-level processing; noisy points; pattern analysis; perceptual grouping; second degree curve fitting; Acoustic noise; Computer aided software engineering; Computer vision; Curve fitting; Least squares approximation; Parameter estimation; Pattern analysis; Pattern recognition; Statistics; Stochastic processes;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
