• DocumentCode
    1246924
  • Title

    Sensor modeling, probabilistic hypothesis generation, and robust localization for object recognition

  • Author

    Wheeler, Mark D. ; Ikeuchi, Katsushi

  • Author_Institution
    Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    17
  • Issue
    3
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    252
  • Lastpage
    265
  • Abstract
    In an effort to make object recognition efficient and accurate enough for real applications; we have developed three probabilistic techniques-sensor modeling, probabilistic hypothesis generation, and robust localization-which form the basis of a promising paradigm for object recognition. Our techniques effectively exploit prior knowledge to reduce the number of hypotheses that must be tested during recognition. Our recognition approach utilizes statistical constraints on the matches between image and model features. These statistical constraints are computed using a model of the entire sensing process-resulting in more realistic and tighter constraints on matches. The candidate hypotheses are pruned by probabilistic constraint satisfaction to select likely matches based on the image evidence and prior statistical constraints. The resulting hypotheses are ordered most-likely first for verification. Thus minimizing unnecessary verifications. The reliability of the verification decision is significantly increased by the use of a robust localization algorithm
  • Keywords
    Markov processes; computer vision; image sensors; object recognition; probability; statistical analysis; stereo image processing; 3D object recognition; Markov random field; computer vision; pose estimation; probabilistic constraint satisfaction; probabilistic hypothesis generation; robust localization; sensor modeling; statistical constraints; Application software; Computer errors; Computer vision; Image recognition; Intelligent robots; Markov random fields; Object recognition; Photometry; Robustness; Testing;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.368190
  • Filename
    368190