• DocumentCode
    1247139
  • Title

    Integrating design and measurement

  • Author

    Ravel, Mihir K.

  • Volume
    8
  • Issue
    1
  • fYear
    2005
  • fDate
    3/1/2005 12:00:00 AM
  • Firstpage
    41
  • Lastpage
    45
  • Abstract
    At the 2004 International Instrumentation and Measurement Conference in Italy, a number of us were discussing the growing importance of system-level design and the implications for simulation and measurement technologies. It was puzzling to us that technology continues to increase in complexity, yet the last two decades have seen the design world of simulation and modeling diverge from the world of measurement and testing. Today´s systems, whether they are commercial products or scientific experiments, require a convergence of technologies that makes performance measurement and validation not only more critical but also more prone to error. In the discussions a point that came up repeatedly was the value of bringing the design and test communities closer together, and it was suggested that it was timely to highlight this issue. With that in mind, this note aims to stimulate community discussion by first examining some benefits and challenges of integration and then outlining possible directions for collaboration between the simulation and measurement communities.
  • Keywords
    circuit simulation; circuit testing; design; measurement systems; 2004 International Instrumentation and Measurement Conference; design-measurement integration; measurement community; measurement technology; simulation technology; system-level design; testing; Computational modeling; Computer aided engineering; Design engineering; Instrumentation and measurement; Instruments; Microcomputers; Moore´s Law; Software performance; Testing; Workstations;
  • fLanguage
    English
  • Journal_Title
    Instrumentation & Measurement Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/MIM.2005.1405923
  • Filename
    1405923