DocumentCode :
1247156
Title :
The influence of the arc voltage in synthetic test circuits
Author :
van der Sluis, L. ; Sheng, B.L.
Author_Institution :
Power Syst. Lab., Delft Univ. of Technol., Netherlands
Volume :
10
Issue :
1
fYear :
1995
fDate :
1/1/1995 12:00:00 AM
Firstpage :
274
Lastpage :
279
Abstract :
In this paper different arc voltage waveforms and KEMA arc models are used to study the stress of the direct SLF (short line fault) test circuit and the synthetic SLF test circuit on the TB (test breaker). For the synthetic test circuit the total arc energy input in the TB is less than in the direct test circuit, but just before the current zero the dI/dt and subsequently the arc energy input in the TB is higher. It is demonstrated that the arc-circuit interaction plays an important role for the TB to clear the fault. For SF6 breakers with an arc voltage with a significant extinguishing peak, the voltage injection synthetic test circuit produces an overstress for the TB
Keywords :
SF6 insulation; arcs (electric); circuit-breaking arcs; gas blast circuit breakers; switchgear testing; KEMA arc models; SF6; SF6 breakers; arc voltage; direct test circuit; overstress; short line fault test circuit; synthetic test circuit; synthetic test circuits; total arc energy input; voltage injection synthetic test circuit; Circuit breakers; Circuit faults; Circuit testing; Laboratories; Power system faults; Power system modeling; Short circuit currents; Stress; System testing; Voltage;
fLanguage :
English
Journal_Title :
Power Delivery, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8977
Type :
jour
DOI :
10.1109/61.368389
Filename :
368389
Link To Document :
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