Title :
Low temperature aging of XLPE and EP insulated cables with voltage transients
Author :
Katz, C. ; Seman, G.W. ; Bernstein, B.S.
Author_Institution :
Cable Technol. Lab. Inc., New Brunswick, NJ, USA
fDate :
1/1/1995 12:00:00 AM
Abstract :
This paper presents the interim results of tests conducted on 15 kV crosslinked polyethylene (XLPE) and ethylene propylene (EP) insulated cables aged under identical conditions for 36 months at 30°C (±5°C) with and without applied voltage transients. Aging voltages were from 1 to 2.5 times rated voltage. Failures during aging have occurred in EP insulated cable while none have occurred in XLPE insulated cable. Both types of cable experienced a large drop in AC and impulse voltage breakdown strength early in the aging process, There is an indication that voltage transients have slightly affected the AC and impulse voltage breakdown strength and contributed to the EP cable aging failures
Keywords :
XLPE insulation; electric breakdown; failure analysis; impulse testing; insulation testing; life testing; power cable insulation; power cable testing; transients; 15 kV; 30 C; 36 y; AC breakdown strength; EP insulated cables; XLPE insulated cables; cable aging failures; crosslinked polyethylene; ethylene propylene; impulse voltage breakdown strength; low temperature aging; voltage transients; Accelerated aging; Cable insulation; Cables; Conductors; Dielectric breakdown; Dielectrics and electrical insulation; Manufacturing; Temperature; Testing; Voltage;
Journal_Title :
Power Delivery, IEEE Transactions on
