DocumentCode :
1247269
Title :
Size dependence of carrier recombination efficiency in GaN quantum dots
Author :
Neogi, Arup ; Everitt, Henry ; Morkoç, Hadis ; Kuroda, Takamasa ; Tackeuchi, Atsushi
Author_Institution :
Dept. of Phys., Univ. of North Texas, Denton, TX, USA
Volume :
4
Issue :
2
fYear :
2005
fDate :
3/1/2005 12:00:00 AM
Firstpage :
297
Lastpage :
299
Abstract :
The dependence of radiative recombination rate and efficiency on GaN quantum-dot (QD) size and temperature is studied by time-resolved photoluminescence (PL) spectroscopy. The emission is dominated by radiative recombination at low temperatures (<125 K) and exhibits high PL efficiency at room temperature. The radiative lifetime and the relative quantum efficiency decrease with the decreasing QD size.
Keywords :
III-V semiconductors; electron-hole recombination; gallium compounds; nanostructured materials; photoluminescence; radiative lifetimes; semiconductor quantum dots; time resolved spectra; wide band gap semiconductors; 293 to 298 K; GaN; GaN quantum dots; PL efficiency; carrier recombination efficiency; quantum efficiency; radiative lifetime; radiative recombination; room temperature; size dependence; time-resolved photoluminescence spectroscopy; Gallium nitride; Molecular beam epitaxial growth; Photoluminescence; Physics; Plasma temperature; Quantum dots; Radiative recombination; Spectroscopy; Temperature dependence; US Department of Transportation; GaN; molecular-beam epitaxy; quantum dots (QDs); semiconductor nanostructures; time-resolved photoluminescence (PL);
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2004.834170
Filename :
1406009
Link To Document :
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