• DocumentCode
    1247317
  • Title

    Design of a 3-D fully depleted SOI computational RAM

  • Author

    Koob, John C. ; Leder, Daniel A. ; Sung, Raymond J. ; Brandon, Tyler L. ; Elliott, Duncan G. ; Cockburn, Bruce F. ; McIlrath, Lisa

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, Alta., Canada
  • Volume
    13
  • Issue
    3
  • fYear
    2005
  • fDate
    3/1/2005 12:00:00 AM
  • Firstpage
    358
  • Lastpage
    369
  • Abstract
    We introduce a three-dimensional (3-D) processor-in-memory integrated circuit design that provides progressively increasing processing power as the number of stacked dies increases, while incurring no extra design effort or mask sets. Innovative techniques for processor/memory redundancy and fast global bus evaluation are described. The architecture can be augmented with a nearest-neighbor physical 3-D communications network that can substantially reduce interconnect lengths and relieve routing congestion. The test chip, with 128 Kb of memory and 512 processing elements (PEs) on two fully depleted silicon-on-insulator (SOI) dies, can achieve a peak of 170 billion-bit-operations per second at 400 MHz.
  • Keywords
    CMOS memory circuits; integrated circuit design; integrated circuit interconnections; memory architecture; multiprocessor interconnection networks; random-access storage; silicon-on-insulator; 128 kbit; 3D fully depleted SOI computational RAM; 3D processor-in-memory integrated circuit design; 400 MHz; Si; fast global bus evaluation; integrated circuit testing; interconnect length reduction; memory architecture; nearest neighbor physical 3D communication network; parallel processing; processor-memory redundancy; silicon on insulator dies; stacked dies; Capacitance; Communication networks; Integrated circuit interconnections; Laboratories; Parallel processing; Random access memory; Read-write memory; Routing; Silicon on insulator technology; Streaming media; Memory architecture; multiprocessor interconnection; parallel processing; silicon-on-insulator (SOI) technology;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2004.842890
  • Filename
    1406042