Title : 
A 2.5-GHz eight-phase VCO in SiGe BiCMOS technology
         
        
            Author : 
Herzel, Frank ; Winkler, Wolfgang
         
        
            Author_Institution : 
IHP, Frankfurt, Germany
         
        
        
        
        
            fDate : 
3/1/2005 12:00:00 AM
         
        
        
        
            Abstract : 
We present a 2.5-GHz voltage-controlled oscillator (VCO) with eight equally distributed phases derived from a 10-GHz LC VCO. Stochastic and static phase errors were obtained by spectrum analyzer measurements in conjunction with an on-chip single-sideband mixer. From the measured phase noise spectrum, we predict an absolute rms jitter contribution of 130 fs in a 2-MHz bandwidth phase-locked loop. A static phase error of less than 0.7° was deduced from the sideband suppression. The eight-phase VCO is tunable from 2.35 to 2.85 GHz and draws 16 mA from a 2.0-V supply. Possible applications include clock and data recovery of a 10-Gb/s signal in a fiber-optic receiver as well as high-precision image rejection receivers and I/Q direct up-converters for radio-frequency applications.
         
        
            Keywords : 
BiCMOS integrated circuits; Ge-Si alloys; phase locked loops; phase noise; synchronisation; timing jitter; voltage-controlled oscillators; 10 Gbit/s; 130 fs; 16 mA; 2 MHz; 2.0 V; 2.5 GHz; LC VCO; SiGe; SiGe BiCMOS technology; clock recovery; data recovery; direct up-converters; eight-phase VCO; equally distributed phases; fiber-optic receiver; image rejection receivers; on-chip single-sideband mixer; phase errors; phase-locked loop; quarter-rate sampling; sideband suppression; spectrum analyzer measurements; timing jitter; voltage-controlled oscillator; BiCMOS integrated circuits; Germanium silicon alloys; Jitter; Noise measurement; Phase measurement; Phase noise; Silicon germanium; Spectral analysis; Stochastic resonance; Voltage-controlled oscillators; Clock and data recovery (CDR); oscillator; quarter-rate sampling; timing jitter;
         
        
        
            Journal_Title : 
Circuits and Systems II: Express Briefs, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TCSII.2004.842057