Pure-mode network analyzer concept for on-wafer measurements of differential circuits at millimeter-wave frequencies

Author

Zwick, Thomas ; Pfeiffer, Ullrich R.

Volume

53

Issue

3

fYear

2005

fDate

3/1/2005 12:00:00 AM

Firstpage

934

Lastpage

937

Abstract

A measurement concept based on a two-port vector network analyzer has been developed, which enables pure-mode on-wafer measurements of differential circuits in the millimeter-wave frequency range. An error model for the measurement system is derived as required for future calibration algorithms. Based on WR15 waveguide components, together with 1.85-mm coaxial probes, a setup has been built and its amplitude and phase imbalances have been characterized in the frequency range from 50 to 65 GHz.

Keywords

error analysis; integrated circuit measurement; millimetre wave measurement; network analysers; probes; two-port networks; waveguide components; 1.85 mm; 50 to 65 GHz; WR15 waveguide components; amplitude imbalance; calibration algorithm; coaxial probes; differential circuits; error model; measurement system; millimeter wave frequency range; phase imbalance; pure mode on wafer measurements; pure mode vector network analyzer; two port vector network analyzer; Coaxial cables; Frequency measurement; Impedance matching; Millimeter wave circuits; Millimeter wave measurements; Probes; Switches; Testing; Vectors; Waveguide components; Differential measurements; millimeter-wave (MMW) measurements; vector network analyzer (VNA);

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/TMTT.2004.842488

Filename

1406288