Title :
Implementation of a High-Performance GaN-Based Light-Emitting Diode Grown on a Nanocomb-Shaped Patterned Sapphire Substrate
Author :
Jian-Kai Liou ; Chun-Chia Chen ; Po-Cheng Chou ; Zong-Jie Tsai ; Yu-Chih Chang ; Wen-Chan Liu
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
A GaN-based light-emitting diode (LED) grown on a nanocomb-shaped patterned sapphire substrate (PSS) is fabricated and studied. Nanocomb-shaped patterns are transferred on a sapphire substrate using a well-ordered anodized aluminum oxide (AAO) thin film as a mask for the inductively coupled plasma etching process. This well-ordered AAO thin film with a high aspect ratio is grown on a sapphire substrate by an oxalic acid-based electrochemical system and a three-step anodization. The strain state generated during epitaxial growth could be effectively alleviated by the use of nanocomb-shaped PSS. The treading dislocation density could be reduced. Thus, the enhanced crystalline quality is obtained. In addition, due to the presence of photonic crystal-like air buffer layer, part of reflected photons upward the top side could be scattered by this layer. Therefore, more photons could be extracted outside. Experimentally, at 20 mA, as compared with a conventional LED grown on a planar sapphire substrate, the studied LED grown on a nanocomb-shaped PSS shows 53.8% and 43.7% enhancements in light output power and external quantum efficiency as well as a reduced leakage current.
Keywords :
III-V semiconductors; anodisation; dislocation density; epitaxial growth; gallium compounds; integrated optoelectronics; leakage currents; light emitting diodes; nanofabrication; nanophotonics; photonic crystals; semiconductor growth; sputter etching; Al2O3; GaN-Al2O3; LED; anodized aluminum oxide thin film; aspect ratio; current 20 mA; efficiency 43.7 percent; efficiency 53.8 percent; enhanced crystalline quality; epitaxial growth; external quantum efficiency; high-performance light-emitting diode; inductively coupled plasma etching; light output power; nanocomb-shaped patterned sapphire substrate; oxalic acid-based electrochemical system; photonic crystal-like air buffer layer; reduced leakage current; strain state; three-step anodization; treading dislocation density; well-ordered AAO thin film; Films; Gallium nitride; Light emitting diodes; Nanoscale devices; Photonics; Scanning electron microscopy; Substrates; GaN; anodized aluminum oxide; crystalline quality; light-emitting diodes; nanocomb-shaped pattern; patterned sapphire substrate;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2014.2365022