• DocumentCode
    1248191
  • Title

    A Method to Estimate the Junction Temperature of Photodetectors Operating at High Photocurrent

  • Author

    Chen, Hao ; Beling, Andreas ; Pan, Huapu ; Campbell, Joe C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA
  • Volume
    45
  • Issue
    12
  • fYear
    2009
  • Firstpage
    1537
  • Lastpage
    1541
  • Abstract
    A method to estimate the junction temperature while operating at high photocurrent levels is presented. The relative responsivity change is measured at high operating current. Using a model for the temperature-dependence of the bandgap, a relation between the relative change in the output power and the internal junction temperature is derived. Good agreement between experimental data and simulations is achieved.
  • Keywords
    photodetectors; photodiodes; junction temperature estimation; photodetectors; photodiodes; relative responsivity change; Bandwidth; Extraterrestrial measurements; Photoconductivity; Photodetectors; Photodiodes; Power generation; Radio frequency; Temperature sensors; Voltage; Wavelength measurement; InGaAs; photodetector; photodiode (PD);
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2009.2023609
  • Filename
    5308579
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1248191