• DocumentCode
    1248664
  • Title

    Signal integrity: Efficient, physics-based via modeling: Integration of striplines

  • Author

    Rimolo-Donadio, R. ; Selli, G. ; De Paulis, F. ; Xiaoxiong Gu ; Kwark, Y.H. ; Drewniak, J.L. ; Bruens, H.-D. ; Schuster, C.

  • Author_Institution
    T.J. Watson Res. Center, IBM, Yorktown Heights, NY, USA
  • Volume
    1
  • Issue
    2
  • fYear
    2012
  • Firstpage
    74
  • Lastpage
    81
  • Abstract
    In the first article of this series, principles and methods of physics-based via modeling were discussed. It was shown how the electromagnetic behavior of vias can be captured by an equivalent circuit based modeling approach that describes all relevant full-wave effects. In this follow-up article, the authors present an approach to integrate striplines into the physics-based via model. The striplines can be located at any layer of the stackup and they may constitute both single and multiconductor transmission lines. The integration of striplines extends the via representation to a full, efficient interconnect model of, for instance, printed circuit board signal links. An intuitive integration approach at a circuit simulator level and application examples are discussed in this article as well.
  • Keywords
    equivalent circuits; high-frequency transmission lines; integrated circuit interconnections; integrated circuit modelling; strip lines; circuit simulator level; electromagnetic behavior; equivalent circuit based modeling approach; interconnect model; intuitive integration approach; multiconductor transmission lines; physics-based via modeling; printed circuit board signal links; stripline Integration; Cavity resonators; Computational modeling; Electromagnetic compatibility; Impedance; Integrated circuit modeling; Parallel plates; physics-based; power distribution network; printed circuit board; signal and power integrity; via and trace model;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    2162-2264
  • Type

    jour

  • DOI
    10.1109/MEMC.2012.6244976
  • Filename
    6244976