DocumentCode
1248829
Title
Effects of Nanoscale Contacts to Graphene
Author
Franklin, Aaron D. ; Han, Shu-Jen ; Bol, Ageeth A. ; Haensch, Wilfried
Author_Institution
T.J. Watson Res. Center, IBM, Yorktown Heights, NY, USA
Volume
32
Issue
8
fYear
2011
Firstpage
1035
Lastpage
1037
Abstract
Understanding and optimizing transport between metal contacts and graphene is one of the foremost challenges for graphene devices. In this letter, we present the first results on the effects of reducing contact dimensions to the nanoscale in single-layer graphene transistors. Using noninvasive voltage probes to the graphene channel, the contact resistance was extracted and observed to increase dramatically at contact lengths below 200 nm. Also affected was the extrinsic transconductance, reducing by more than 70% when scaling the contacts from 200 to 50 nm. No significant change in performance per unit width was observed when reducing the contact/device width from 500 to 80 nm. These results provide key insights into the ultimate scalability of graphene transistors, particularly when considering them for a densely integrated technology.
Keywords
contact resistance; field effect transistors; graphene; C; contact resistance; extrinsic transconductance; field-effect transistor; graphene channel; nanoscale contact effects; noninvasive voltage probes; single-layer graphene transistors; size 200 nm to 50 nm; size 500 nm to 80 nm; Contact resistance; Metals; Nanoscale devices; Probes; Resistance; Substrates; Transistors; Contact resistance; field-effect transistor; graphene; length scaling;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2011.2158058
Filename
5898385
Link To Document