DocumentCode :
1249046
Title :
DVLASIC: catastrophic fault yield simulation in a distributed processing environment
Author :
Walker, D.M.H. ; Nydick, Daniel S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume :
9
Issue :
6
fYear :
1990
fDate :
6/1/1990 12:00:00 AM
Firstpage :
655
Lastpage :
664
Abstract :
Simulation of local process disturbances is a computationally intensive task. The VLASIC (VLSI LAyout Simulation for Integrated Circuits) catastrophic-fault yield simulator uses a Monte Carlo method that often requires tens of CPU hours to perform a simulation. In order to reduce the simulation time, DVLASIC, the distributed-environment version developed by the authors, achieves a speedup of 13.3 over VLASIC, with an efficiency of 89%. The authors describe the distributed processing environment and implementation techniques used to obtain this speedup. The distributed processing environment can also be applied to many other CAD problems
Keywords :
Monte Carlo methods; VLSI; circuit layout CAD; fault location; DVLASIC; Monte Carlo method; VLSI LAyout Simulation for Integrated Circuits; catastrophic fault yield simulation; distributed processing environment; Central Processing Unit; Circuit faults; Circuit simulation; Computational modeling; Design optimization; Distributed processing; Integrated circuit yield; Parallel processing; Very large scale integration; Workstations;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.55195
Filename :
55195
Link To Document :
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