Title :
Fault Location in SF6 Insulated Conductors Using Direct Fluxgate Magnetometry
Author :
Itani, A.M. ; Perry, M.P. ; Houston, J.M.
Author_Institution :
General Electric Company, Schenectady, NY
Keywords :
Conductors; Fault location; Instruments; Magnetic field measurement; Magnetometers; Pattern recognition; Power markets; Substations; Testing; Voltage;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1983.5519621
