DocumentCode :
1249507
Title :
Changes To: Sensitivity Of Reliability-growth Models To Operational Profile Errors Vs Testing Accuracy
Volume :
46
Issue :
1
fYear :
1997
fDate :
3/1/1997 12:00:00 AM
Firstpage :
68
Lastpage :
68
Keywords :
Books; Computer aided manufacturing; Computer errors; Digital systems; Electronic mail; Fault tolerance; Fault tolerant systems; Internet; Microprogramming; Testing;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1997.589929
Filename :
589929
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1249507
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