DocumentCode
1249630
Title
An accurate analytical delay model for BiCMOS driver circuits
Author
Diaz, Carlos H. ; Kang, Sung-Mo ; Leblebic, Yusuf
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume
10
Issue
5
fYear
1991
fDate
5/1/1991 12:00:00 AM
Firstpage
577
Lastpage
588
Abstract
An analytical delay model for BiCMOS driver circuits is presented. The model is based on physical device parameters and can be used to estimate both the pull-up and the pull-down times for a variety of circuit configurations. The intrinsic delay associated with the bipolar transistors is taken into consideration by using a charge control model that incorporates the high-injection effects upon the current gain and the base transport factor. Separate sets of delay equations are derived for the pull-up and pull-down transient responses to account for significant differences between the two cases. The comparison with SPICE circuit simulation results shows that the new model predicts the respective delay times with less than 10% error in most cases. The influence of device dimensions upon the driver delay time is also investigated. The model has been applied to find an optimal area allocation between the CMOS and bipolar parts of the driver circuit when the total available area is limited as in the standard cell configuration
Keywords
BIMOS integrated circuits; delays; driver circuits; semiconductor device models; transient response; BiCMOS driver circuits; analytical delay model; base transport factor; charge control model; current gain; delay equations; driver delay time; high-injection effects; physical device parameters; pull-down times; pull-up times; standard cell configuration; transient responses; Analytical models; BiCMOS integrated circuits; Bipolar transistors; Circuit analysis; Circuit simulation; Delay effects; Difference equations; Driver circuits; SPICE; Semiconductor device modeling;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.79495
Filename
79495
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