DocumentCode :
1249642
Title :
Series-system reliability-estimation using very small binomial samples
Author :
Willits, Craig J. ; Dietz, Dennis C. ; Moore, Albert H.
Author_Institution :
Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
Volume :
46
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
296
Lastpage :
302
Abstract :
This investigation explored the effect of incorporating prior information into series-system reliability estimates, where the inferences are made using very small sets (less than 10 observations) of binomial test-data. To capture this effect, the performance of a set of Bayes interval estimators was compared to that of a set of classical estimators over a wide range of subsystem beta prior-distribution parameters. During a Monte Carlo simulation, the Bayes estimators tended to provide shorter interval estimators when the mean of the prior system-reliability differed from the true reliability by 20 percent of less, but the classical estimators dominated when the difference was greater. Based on these results, the authors conclude that there is no clear advantage to using Bayes interval estimation for sample sizes less than 10 unless the poor mean system reliability is believed to be within 20 percent of the true system reliability. Otherwise, the Lindstrom-Madden estimator, a useful classical alternative for very small samples, should be used
Keywords :
Bayes methods; Monte Carlo methods; failure analysis; probability; reliability theory; Bayes interval estimators; Lindstrom-Madden estimator; Monte Carlo simulation; beta prior-distribution parameters; mean system reliability; series-system reliability estimates; very small binomial samples; Costs; Delay estimation; Maximum likelihood estimation; Missiles; Monte Carlo methods; Reliability; Statistical analysis; System testing; Uncertainty; Weapons;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.589960
Filename :
589960
Link To Document :
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