• DocumentCode
    1249658
  • Title

    A charge conserving non-quasi-state (NQS) MOSFET model for SPICE transient analysis

  • Author

    Park, Hong-June ; Ko, Ping Keung ; Hu, Chenming

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • Volume
    10
  • Issue
    5
  • fYear
    1991
  • fDate
    5/1/1991 12:00:00 AM
  • Firstpage
    629
  • Lastpage
    642
  • Abstract
    An analytic charge-conserving non-quasi-static (NQS) model is derived for long-channel MOSFETs and has been implemented in SPICE3. The model is based on approximate solutions to the transient current continuity equation, an analytic equations are derived for node charges using the charge-sheet formulation. The NQS effects in several test circuits, which include a pass transistor, a CMOS inverter chain, and a differential sample-hold circuit, are stimulated. Excellent agreements have been observed among this work, PISCES (2-D device simulation), the 1-D numerical simulation, the multiple lump model, and CODECS (a mixed device and circuit simulation). However, large differences have been observed between this work and conventional quasi-static (QS) models. The model computation time of this work implemented in SPICE3 is about 2-3 times larger than those of QS models (BSIM, Level-2 Meyer) in SPICE3
  • Keywords
    circuit analysis computing; insulated gate field effect transistors; semiconductor device models; transient response; MOSFET model; NQS effects; SPICE transient analysis; SPICE3; approximate solutions; charge conserving; charge-sheet formulation; long-channel MOSFETs; model computation time; node charges; nonquasistatic model; transient current continuity equation; Circuit simulation; Circuit testing; Computational modeling; Equations; Inverters; MOSFET circuits; Numerical simulation; SPICE; Semiconductor device modeling; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.79500
  • Filename
    79500