DocumentCode :
1249787
Title :
Porous Silicon in a Semiconductor Manufacturing Environment
Author :
Boehringer, Matthias ; Artmann, Hans ; Witt, Kevin
Author_Institution :
RtP1/MFW5, Robert Bosch GmbH, Reutlingen, Germany
Volume :
21
Issue :
6
fYear :
2012
Firstpage :
1375
Lastpage :
1381
Abstract :
In the Bosch-proprietary “advanced porous silicon membrane process”, porous silicon (PSi) is used for the first time in high-volume industrial production of microelectromechanical devices. Nanoporous silicon acts as an auxiliary layer during manufacturing of monolithically integrated pressure sensors in a mixed-signal IC process supplemented by microelectromechanical-systems-specific steps in the front end of line. In this paper, the technical design and performance of a fully automated production tool capable of high-volume fabrication of PSi under the specific constraints of a semiconductor manufacturing environment are discussed. The process requires stringent control on the PSi layer thickness, uniformity, porosity, and morphology. The impact of chamber and electrode geometry, the electrolyte flow, and the mode of current coupling into the wafer back side on the uniformity of the PSi layer is addressed. The need for a well-defined PSi morphology demands high reproducibility and stability of the electrolyte composition, particularly with respect to the hydrofluoric acid concentration.
Keywords :
integrated circuit manufacture; micromechanical devices; mixed analogue-digital integrated circuits; nanoporous materials; pressure sensors; silicon; Bosch; PSi layer morphology; PSi layer porosity; PSi layer thickness; PSi layer uniformity; advanced porous silicon membrane process; electrode geometry; electrolyte composition; electrolyte flow; hydrofluoric acid concentration; integrated circuit process; microelectromechanical device; mixed-signal IC process; monolithically integrated pressure sensor; nanoporous silicon; production tool performance; production tool technical design; semiconductor manufacturing environment; CMOS integrated circuits; Cavity resonators; Current density; Electrodes; Porous semiconductors; Production; Silicon; CMOS manufacturing; microelectromechanical devices; microelectromechanical systems (MEMS); micromachining; porous semiconductors; porous silicon (PSi); pressure sensors; silicon;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2012.2205900
Filename :
6248150
Link To Document :
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