Title :
OBDD-based network reliability calculation
Author :
Yeh, Fu-Min ; Kuo, Sy-Yen
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fDate :
4/24/1997 12:00:00 AM
Abstract :
An efficient method for evaluating the terminal-pair reliability based on an edge expansion tree and using an OBDD (ordered binary decision diagram) is presented. The effectiveness of the algorithm is demonstrated on the larger benchmarks collected in previous work. One notable case of the experimental results for a 2×20 lattice network is that the number of nodes in the OBDD is linearly proportional to the number of stages. This is significantly superior to previous algorithms which are based on the sum of disjoint products and has exponential complexity
Keywords :
reliability theory; OBDD-based reliability calculation; edge expansion tree; network reliability calculation; ordered BDD; ordered binary decision diagram; terminal-pair reliability;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19970549