• DocumentCode
    1250025
  • Title

    Simulation of a QMS Including the Effects of Pressure in the Electron-Impact Ion Source

  • Author

    Sreekumar, Jeyan ; Hogan, Thomas J. ; Taylor, Stephen

  • Author_Institution
    Dept. of Electr. Eng. & Electron., Univ. of Liverpool, Liverpool, UK
  • Volume
    61
  • Issue
    11
  • fYear
    2012
  • Firstpage
    3024
  • Lastpage
    3030
  • Abstract
    This paper is concerned with the computer modeling of a quadrupole mass spectrometer (QMS) to include the effect of pressure in the ion source. The paper simulates the spectra over the pressure range from 10-6 to 10-4 mbar. An important contribution is the development of a novel procedure to include pressure dependence of the ion source to allow better prediction of instrument performance. Electron-impact total ionization cross sections in the ionic current expression are calculated using the binary-encounter-Bethe theory for argon gas. The predicted results show good agreement with the experimental results obtained from a commercial QMS used for residual gas analysis.
  • Keywords
    chemical analysis; electron sources; ion sources; mass spectrometers; binary-encounter-Bethe theory; commercial QMS; computer modeling; electron-impact ion source; electron-impact total ionization cross sections; hyperbolic QMS; ion source; ionic current expression; pressure effect; quadrupole mass spectrometer; residual gas analysis; Argon; Electrodes; Ion sources; Ionization; Mass spectroscopy; Mathematical model; Binary-encounter-Bethe (BEB); electron-impact ion source; gas measurement; ionic current; partial pressure; quadrupole mass spectrometer (QMS); quadrupole mass spectrometry; residual gas analyzer;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2012.2202166
  • Filename
    6248217