DocumentCode :
1250025
Title :
Simulation of a QMS Including the Effects of Pressure in the Electron-Impact Ion Source
Author :
Sreekumar, Jeyan ; Hogan, Thomas J. ; Taylor, Stephen
Author_Institution :
Dept. of Electr. Eng. & Electron., Univ. of Liverpool, Liverpool, UK
Volume :
61
Issue :
11
fYear :
2012
Firstpage :
3024
Lastpage :
3030
Abstract :
This paper is concerned with the computer modeling of a quadrupole mass spectrometer (QMS) to include the effect of pressure in the ion source. The paper simulates the spectra over the pressure range from 10-6 to 10-4 mbar. An important contribution is the development of a novel procedure to include pressure dependence of the ion source to allow better prediction of instrument performance. Electron-impact total ionization cross sections in the ionic current expression are calculated using the binary-encounter-Bethe theory for argon gas. The predicted results show good agreement with the experimental results obtained from a commercial QMS used for residual gas analysis.
Keywords :
chemical analysis; electron sources; ion sources; mass spectrometers; binary-encounter-Bethe theory; commercial QMS; computer modeling; electron-impact ion source; electron-impact total ionization cross sections; hyperbolic QMS; ion source; ionic current expression; pressure effect; quadrupole mass spectrometer; residual gas analysis; Argon; Electrodes; Ion sources; Ionization; Mass spectroscopy; Mathematical model; Binary-encounter-Bethe (BEB); electron-impact ion source; gas measurement; ionic current; partial pressure; quadrupole mass spectrometer (QMS); quadrupole mass spectrometry; residual gas analyzer;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2012.2202166
Filename :
6248217
Link To Document :
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