The invariance of node-voltage sensitivity sequence and its application in a unified fault detection dictionary method

Author

Li, Feng ; Woo, Peng-Yung

Author_Institution

Dept. of Electron. Eng., Fudan Univ., Shanghai, China

Volume

46

Issue

10

fYear

1999

fDate

10/1/1999 12:00:00 AM

Firstpage

1222

Lastpage

1227

Abstract

This paper proposes and proves an important theorem and its corollary for linear analog circuits, i.e., the invariance of the node-voltage sensitivity sequence and the invariance of the node-voltage change sequence. Based on them, a unified fault detection dictionary method for both hard and soft faults in analog circuits is proposed. This method uses only one fault characteristic code to detect any hard or soft fault of any component. In addition, the size of the dictionary is only one half of that of the original hard fault dictionary

Keywords

analogue circuits; circuit analysis computing; circuit testing; fault diagnosis; invariance; hard faults; invariance; linear analog circuits; node-voltage change sequence; node-voltage sensitivity sequence; single fault characteristic code; soft faults; unified fault detection dictionary method; Analog circuits; Circuit faults; Dictionaries; Electrical fault detection; Fault detection; Fault diagnosis; Voltage;

fLanguage

English

Journal_Title

Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on

Publisher

ieee

ISSN

1057-7122

Type

jour

DOI

10.1109/81.795835

Filename

795835