Title :
The invariance of node-voltage sensitivity sequence and its application in a unified fault detection dictionary method
Author :
Li, Feng ; Woo, Peng-Yung
Author_Institution :
Dept. of Electron. Eng., Fudan Univ., Shanghai, China
fDate :
10/1/1999 12:00:00 AM
Abstract :
This paper proposes and proves an important theorem and its corollary for linear analog circuits, i.e., the invariance of the node-voltage sensitivity sequence and the invariance of the node-voltage change sequence. Based on them, a unified fault detection dictionary method for both hard and soft faults in analog circuits is proposed. This method uses only one fault characteristic code to detect any hard or soft fault of any component. In addition, the size of the dictionary is only one half of that of the original hard fault dictionary
Keywords :
analogue circuits; circuit analysis computing; circuit testing; fault diagnosis; invariance; hard faults; invariance; linear analog circuits; node-voltage change sequence; node-voltage sensitivity sequence; single fault characteristic code; soft faults; unified fault detection dictionary method; Analog circuits; Circuit faults; Dictionaries; Electrical fault detection; Fault detection; Fault diagnosis; Voltage;
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
