Title :
Correction to "Selection criteria for F and N-channel JFETs as input elements in low-noise radiation-hard charge preamplifiers"
Author :
Manghisoni, M. ; Ratti, L. ; Re, V. ; Speziali, V.
Author_Institution :
Studio di Microelettronica, STMicroelectronics
Keywords :
Capacitance; Detectors; JFETs; Leak detection; Leakage current; Preamplifiers;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2001.983254
