Title :
Real-time flat-panel pixel imaging system and control for X-ray and neutron detection
Author :
Chapuy, Sylvie ; Dimcovski, Marc ; Dimcovski, Zlatko ; Lehmann, Eberhard H. ; Pachoud, Marc ; Valley, Jean-François ; Verdun, Francis R. ; Vontobel, Peter
Author_Institution :
Bio-Scan SA, Meyrin/Geneva, Switzerland
Abstract :
We present in this paper industrial nondestructive X-ray and neutron testing applications with a real-time digital imaging device and control system X-View based on active matrix flat-panel imager technology. X-View consists of X-ray or neutron converters, arrays of amorphous silicon (a-Si:H) thin-film transistors and photodiodes, a fast real-time electronic system for readout and digitization of images and appropriate computer tools for control, real-time image treatment data representation, and off-line analysis. Some basic image-quality parameters and different objects were assessed for quantitative and qualitative analysis. Results show a wide dynamic range (16 bits ADC resolution) and lack of blooming, a high frame rate (up to 25 fps), and rapid image capture. Images are directly displayed, on-line, on a PC monitor and archived in a digital form for radiography and radioscopy procedures and limitless industrial applications in X-ray and neutron inspections.
Keywords :
X-ray detection; diagnostic radiography; neutron detection; neutron radiography; nondestructive testing; silicon radiation detectors; PC monitor; X-View; X-ray detection; active matrix flat-panel imager technology; amorphous silicon thin-film photodiodes; amorphous silicon thin-film transistors; data representation; digitization; fast real-time electronic system; image-quality parameters; industrial nondestructive X-ray testing applications; industrial nondestructive neutron testing applications; neutron detection; neutronoscopy; off-line analysis; radiography procedures; radioscopy procedures; real-time flat-panel pixel imaging system; real-time image treatment; Control systems; Electrical equipment industry; Image analysis; Industrial control; Neutrons; Nondestructive testing; Optical imaging; Pixel; Real time systems; X-ray imaging;
Journal_Title :
Nuclear Science, IEEE Transactions on