• DocumentCode
    1250985
  • Title

    60 Gbit/s time-division multiplexer in SiGe-bipolar technology with special regard to mounting and measuring technique

  • Author

    Muller, Mathias ; Rein, H.-M. ; Felder, A. ; Meister, T.F.

  • Author_Institution
    Ruhr-Univ., Bochum
  • Volume
    33
  • Issue
    8
  • fYear
    1997
  • fDate
    4/10/1997 12:00:00 AM
  • Firstpage
    679
  • Lastpage
    680
  • Abstract
    A 2:1 time-division multiplexer is presented which operates at up to 60 Gbit/s. This is the highest data rate ever achieved by an integrated circuit in any technology. The output voltage swing is 0.5 V p-p (for 50Ω on-chip matching and 50Ω external load). The chips were fabricated using an advanced SiGe-bipolar technology (fT=68 GHz) and then mounted on a comparatively simple measuring socket
  • Keywords
    Ge-Si alloys; 60 Gbit/s; SiGe; SiGe-bipolar technology; integrated circuit; measuring socket; mounting; time-division multiplexer;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19970442
  • Filename
    591003
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1250985