• DocumentCode
    1251528
  • Title

    Behavioral-level fault simulation

  • Author

    Ghosh, Sumit

  • Author_Institution
    AT&T Bell Lab., Holmdel, NJ, USA
  • Volume
    5
  • Issue
    3
  • fYear
    1988
  • fDate
    6/1/1988 12:00:00 AM
  • Firstpage
    31
  • Lastpage
    42
  • Abstract
    An approach to fault simulation is presented in which behavioral fault models represent complex failures in VLSI designs. Errors are deliberately introduced into the description of a design that contains no faults. These errors can be fault values of variables that represent state or timing parameters, a faulty description that is substituted for part of the good description, or a combination of these. The algorithm guarantees accurate results by deferring the output assignments. The approach can also be used to detect and discard inconsistent output assignments. The algorithm has been implemented in Stanford University´s Sable simulator using the Adlib behavioral modeling language.<>
  • Keywords
    VLSI; digital simulation; fault location; logic testing; Adlib behavioral modeling language; Sable simulator; VLSI designs; behavioral fault models; fault simulation; output assignments; timing parameters; Algorithm design and analysis; Clocks; Counting circuits; Fault detection; Fault diagnosis; Hardware; Microprocessors; Reactive power; Testing; Timing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.7961
  • Filename
    7961