• DocumentCode
    1251757
  • Title

    Hysteresis in quartz resonators-a review

  • Author

    Kusters, John A. ; Vig, John R.

  • Author_Institution
    Hewlett-Packard Co., Santa Clara, CA, USA
  • Volume
    38
  • Issue
    3
  • fYear
    1991
  • fDate
    5/1/1991 12:00:00 AM
  • Firstpage
    281
  • Lastpage
    290
  • Abstract
    The literature on the frequency versus temperature characteristics of quartz crystal resonators is reviewed. Three papers that deal with frequency versus pressure hysteresis are included, as these may possibly have relevance to frequency versus temperature hysteresis. It is seen that the causes of hysteresis are not well understood. The evidence to date is inconclusive. The mechanisms that can cause hysteresis include: strain changes changes in the quartz, contamination redistribution, oscillator circuitry hysteresis, and apparent hysteresis due to thermal gradients. The results to date seem to indicate that lattice defects are somehow related to thermal hysteresis. Stress relief in the mounting structure can also produce significant hysteresis. As crystal processing techniques have improved. contamination has become less of a problem.<>
  • Keywords
    crystal resonators; quartz; reviews; contamination redistribution; crystal processing; frequency/temperature characteristics; hysteresis; lattice defects; mounting structure; oscillator circuitry; pressure; quartz resonators; strain changes; thermal gradients; Books; Capacitive sensors; Contamination; Contracts; Frequency control; Hysteresis; Oscillators; Resonant frequency; Stability; Temperature;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.79613
  • Filename
    79613