DocumentCode :
1251757
Title :
Hysteresis in quartz resonators-a review
Author :
Kusters, John A. ; Vig, John R.
Author_Institution :
Hewlett-Packard Co., Santa Clara, CA, USA
Volume :
38
Issue :
3
fYear :
1991
fDate :
5/1/1991 12:00:00 AM
Firstpage :
281
Lastpage :
290
Abstract :
The literature on the frequency versus temperature characteristics of quartz crystal resonators is reviewed. Three papers that deal with frequency versus pressure hysteresis are included, as these may possibly have relevance to frequency versus temperature hysteresis. It is seen that the causes of hysteresis are not well understood. The evidence to date is inconclusive. The mechanisms that can cause hysteresis include: strain changes changes in the quartz, contamination redistribution, oscillator circuitry hysteresis, and apparent hysteresis due to thermal gradients. The results to date seem to indicate that lattice defects are somehow related to thermal hysteresis. Stress relief in the mounting structure can also produce significant hysteresis. As crystal processing techniques have improved. contamination has become less of a problem.<>
Keywords :
crystal resonators; quartz; reviews; contamination redistribution; crystal processing; frequency/temperature characteristics; hysteresis; lattice defects; mounting structure; oscillator circuitry; pressure; quartz resonators; strain changes; thermal gradients; Books; Capacitive sensors; Contamination; Contracts; Frequency control; Hysteresis; Oscillators; Resonant frequency; Stability; Temperature;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.79613
Filename :
79613
Link To Document :
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