Title :
Accurate measurements of the acoustical physical constants of LiNbO/sub 3/ and LiTaO/sub 3/ single crystals
Author :
Kushibiki, Jun-ichi ; Takanaga, Izumi ; Arakawa, Mototaka ; Sannomiya, Toshio
Author_Institution :
Dept. of Electr. Eng., Tohoku Univ., Sendai, Japan
Abstract :
The acoustical physical constants (elastic constant, piezoelectric constant, dielectric constant, and density) of commercial surface acoustic wave (SAW)-grade LiNbO/sub 3/ and LiTaO/sub 3/ single crystals were determined by measuring the bulk acoustic wave velocities, dielectric constants, and densities of many plate specimens prepared from the ingots. The maximum probable error in each constant was examined by considering the dependence of each constant on the measured acoustic velocities. By comparing the measured values of longitudinal velocities that were not used to determine the constants with the calculated values using the previously mentioned constants, we found that the differences between the measured and calculated values were 1 m/s or less for both LiNbO/sub 3/ and LiTaO/sub 3/ crystals. These results suggest that the acoustical physical constants determined in this paper can give the values of bulk acoustic wave velocities with four significant digits.
Keywords :
density measurement; elastic constants; elastic moduli measurement; lithium compounds; permittivity measurement; piezoelectric materials; surface acoustic waves; ultrasonic velocity measurement; LiNbO/sub 3/; LiTaO/sub 3/; SAW-grade single crystals; US pulse frequency method; accurate measurements; acoustical physical constants; bulk acoustic wave velocities; density; dielectric constant; elastic constant; leaky SAW; longitudinal velocities; piezoelectric constant; piezoelectric single crystals; plate specimens; Acoustic measurements; Acoustic waves; Chromium; Crystallization; Crystals; Density measurement; Dielectric constant; Dielectric measurements; Length measurement; Velocity measurement;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on