DocumentCode
1251852
Title
A distribution-free lower bound for availability of quantile-based inspection schemes
Author
Yang, Yoonjung ; Klutke, Georgia-Ann
Author_Institution
Samsung Electron. Co., Ltd, Kyunggi-Do, South Korea
Volume
50
Issue
4
fYear
2001
fDate
12/1/2001 12:00:00 AM
Firstpage
419
Lastpage
421
Abstract
This paper develops a lower bound for the availability of quantile-based inspection schemes when device lifetimes are assumed to have an increasing failure rate. The lower bound is useful in designing inspection schemes when lifetime distributions are not explicitly known, but must be estimated from limited failure data
Keywords
failure analysis; inspection; life testing; reliability; device lifetimes; distribution-free lower bound; increasing failure rate; inspection policy; inspection rate; inspection schemes; lifetime distributions; limited failure data; quantile-based inspection schemes availability; Availability; Circuit breakers; Distribution functions; H infinity control; Industrial engineering; Inspection; Life estimation; Lifetime estimation; Protection; Shape;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.983406
Filename
983406
Link To Document